Figure 3 From The Effects Of Microstructure And Ag3sn And Cu6sn5
![figure 3 From The Effects Of Microstructure And Ag3sn And Cu6sn5 figure 3 From The Effects Of Microstructure And Ag3sn And Cu6sn5](https://d3i71xaburhd42.cloudfront.net/38992c41121a2935f028a8fd29367a08fddc80e6/7-Figure3-1.png)
Figure 3 From The Effects Of Microstructure And Ag3sn And Cu6sn5 The aim of this study is to evaluate the electrochemical corrosion behavior of sn 2 wt.% ag and sn 2.8 wt.% cu solder alloys in a 0.5 m nacl solution at 25 o c as a function of microstructure features and ag 3 sn and cu 6 sn 5 intermetallics. both sn ag and sn cu alloys are becoming interesting lead free solder alternatives. @article{osrio2012theeo, title={the effects of microstructure and ag3sn and cu6sn5 intermetallics on the electrochemical behavior of sn ag and sn cu solder alloys}, author={wislei riuper os{\'o}rio and leandro c. peixoto and leonardo r. garcia and amauri garcia and jos{\'e} eduardo spinelli}, journal={international journal of electrochemical.
![figure 1 from The Effects of Microstructure and Ag3sn and Cu6sn5 figure 1 from The Effects of Microstructure and Ag3sn and Cu6sn5](https://d3i71xaburhd42.cloudfront.net/38992c41121a2935f028a8fd29367a08fddc80e6/3-Figure1-1.png)
Figure 1 From The Effects Of Microstructure And Ag3sn And Cu6sn5 The number density of ag 3 sn grains precipitated upon cu 6 sn 5, increases with ag content and reflow temperature (t). • raising of wt. % of ag in solder and lowering of t can cause an increase in grain diameter of ag 3 sn nanoparticles. • the blockading effect of ag 3 sn particles on cu 6 sn 5 imc growth is more pronounced in sn 3ag and. It was found that although the relative cost 1.5 times higher for the sn 2ag alloy compared to that of the sn 2.8cu alloy, its corresponding electrochemical behavior is better in. Sungkhaphaitoon and plookphol 17 studied the effect of sb addition on microstructure, figure 3 (a) the procedure for and sac257 5bi, the ag3sn and cu6sn5 intermetallic compounds are formed. Cu6sn5 intermetallic compound (imc), which occupies most even full of solder joints bringing by the reduced size of interconnection and the multi functional demand for devices, is a critical component contributing to the reliability of the electronic products. in this study, the orientation transformation of the cold end cu6sn5 grains in cu sn xag cu micro solder joints under temperature.
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