Pin On The Transition Shaft hole tolerances for clearance & interference fits. Set max transition set max fanout set max capacitance design optimisation constraints create clock set clock latency set propagated clock set clock uncertainty set clock transition set input delay set output delay set max area select compile strategy top down optimize the design bottom up compile analyze and resolve design problems check design.
Pin On The Transition The trans violation can be because of node resistance and capacitance. by upsizing the driver cell. decreasing the net length by moving cells nearer (or) reducing long routed net. by adding buffers. by increase the width of the route at the violation instance pin. this will decrease the resistance of the route and fix the transition violation. Transition is the time it takes for the pin to change state. setting transition time constraints the above theoretical definitions are to be applied on practical designs. now, the transition time of a net becomes the time required for its driving pin to change logic values (from 10 %( 20%) to the 90 %( 80%) of its maximum value). Design rule constraints: maximum transition time. the transition time of a net is the longest time required for its driving pin to change logic values. transition time is decided on the basis of rise time and fall time. this constraint (max transition) is based on the library data. 1) linear timing model. 2) nonlinear delay model (nldm) cell delay (gate delay): transistors within a gate take a finite time to switch. this means that a change in the input of a gate takes a finite time to cause a change in the output. gate delay = f (input transition (slew) time, output load cnet cpin). cnet >net capacitance.
Pin On The Transition Design rule constraints: maximum transition time. the transition time of a net is the longest time required for its driving pin to change logic values. transition time is decided on the basis of rise time and fall time. this constraint (max transition) is based on the library data. 1) linear timing model. 2) nonlinear delay model (nldm) cell delay (gate delay): transistors within a gate take a finite time to switch. this means that a change in the input of a gate takes a finite time to cause a change in the output. gate delay = f (input transition (slew) time, output load cnet cpin). cnet >net capacitance. We will study stuck at faults in detail in later sections. consequently, the transistor output will always be stuck at 1 and can be modeled by the same. this fault may cause abnormal behavior to the output response of the chip. this is known as a failure in the chip. faults at these levels are technology dependent. Fit tolerances and applications.
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