X Ray Diffraction Patterns Of Znte Cu Films Sputtered On Glass A

X Ray Diffraction Patterns Of Znte Cu Films Sputtered O Xrd patterns of 300 nm thick znte:cu film sputtered on glass substrates and annealed at different rtp process tempera tures are plotted in fig. 5. Copper doped zinc tellurium (znte:cu) films were deposited on borosilicate glass using magnetron co sputtering technique. the influence of the substrate temperature on the structural, morphological, optical and electrical properties of znte:cu films was investigated by x ray diffraction (xrd), raman spectroscopy, x ray photoelectron spectroscopy (xps), atomic force microscopy (afm), uv–vis.

X Ray Diffraction Patterns Of Znte Cu Films Sputtered O Znte:cu films were deposited on glass substrates by radio frequency sputtering using different znte targets with cu concentrations of 1, 3 and 5 at%. the substrate temperatures employed were 300 and 350 °c. cu–te bonds were favored in such a way that semimetallic clusters of cu 2 x te were detected by x ray diffraction for 3 and 5 at% cu. Paradoxically, even a high resistivity znte:cu film deposited by pulsed dc magnetron sputtering can form a low resistivity quasi ohmic back contact for cdte devices. download : download high res image (524kb) download : download full size image; fig. 5. x ray diffraction patterns of znte:cu films sputtered on glass and annealed with rtp. Structural, optical, and electrical properties znte thin films grown by magnetron sputtering technique were studied by x ray diffraction, atomic force microscopy, raman spectroscopy, and electrical conductivity measurements. structural analyses showed that znte thin films grown on soda–lime glass substrates have a cubic crystalline structure. this crystalline nature of the films was also. The influence of the substrate temperature on the structural, morphological, optical and electrical properties of znte:cu films was investigated by x ray diffraction (xrd), raman spectroscopy, x.

X Ray Diffraction Patterns Of Zn Cu Binary Sputtered Films With Structural, optical, and electrical properties znte thin films grown by magnetron sputtering technique were studied by x ray diffraction, atomic force microscopy, raman spectroscopy, and electrical conductivity measurements. structural analyses showed that znte thin films grown on soda–lime glass substrates have a cubic crystalline structure. this crystalline nature of the films was also. The influence of the substrate temperature on the structural, morphological, optical and electrical properties of znte:cu films was investigated by x ray diffraction (xrd), raman spectroscopy, x. X ray diffraction (xrd) patterns of undoped and cu doped znte thin films exhibited polycrystalline behavior with highest sharp peak corresponding to (111) direction as a preferred orientation. the oxidation states of zn 2 , te 2 , te 2 , and cu 2 through high resolution x ray photoelectron spectroscopy (xps) analyses were revealed. The xrd patterns of znte:cu films in fig. 1 reveal that znte:cu films exhibit two distinct diffraction peaks at approximately 25.4° and 51.8° when the substrate temperature is below 400 °c, which correspond to the (111) and (222) planes of cubic znte (c znte) phase (jcpds card no. 75–2085), respectively. the second order diffraction of.

X Ray Diffraction Patterns Of Zn Cu Binary Sputtered Films With X ray diffraction (xrd) patterns of undoped and cu doped znte thin films exhibited polycrystalline behavior with highest sharp peak corresponding to (111) direction as a preferred orientation. the oxidation states of zn 2 , te 2 , te 2 , and cu 2 through high resolution x ray photoelectron spectroscopy (xps) analyses were revealed. The xrd patterns of znte:cu films in fig. 1 reveal that znte:cu films exhibit two distinct diffraction peaks at approximately 25.4° and 51.8° when the substrate temperature is below 400 °c, which correspond to the (111) and (222) planes of cubic znte (c znte) phase (jcpds card no. 75–2085), respectively. the second order diffraction of.